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短路电流上升率对熔断器弧前特性影响的仿真与实验研究
引用本文:蒋小伟,庄劲武,戴超. 短路电流上升率对熔断器弧前特性影响的仿真与实验研究[J]. 船电技术, 2010, 30(2): 1-4. DOI: 10.3969/j.issn.1003-4862.2010.02.011
作者姓名:蒋小伟  庄劲武  戴超
作者单位:海军工程大学,电气与信息工程学院,武汉,430033;海军工程大学,电气与信息工程学院,武汉,430033;海军工程大学,电气与信息工程学院,武汉,430033
摘    要:
限流熔断器通常在短路电流上升过程中熔断,为了寻求短路电流上升率对熔体的弧前特性的影响,本文利用ANSYS有限元分析软件,以狭颈截面积为0.16mm。的熔体为例,对其进行了建模。仿真结果表明,在相同截面断口、短路电流上升率为2~20A/us的条件下,弧前,2f随着电流上升率的增大而减小:电流上升率在10A/us以上,弧前,2f基本一致,变化率小于5%,在10A/us以下,上升率为2A/us其弧前I^2f比10A/us时增大了约21%。在相同电流上升率、狭颈形状的情况下,弧前I^2f与狭颈截面积的平方成正比。并通过实验验证了仿真分析的正确性。

关 键 词:短路电流上升率  熔断器  弧前特性  ANSYS

Simulation and Experiment of Effect of Short Circuit Current's Rise Rate on Fuse's Pre-arcing Characteristics
Jiang Xiaowei,Zhuang Jinwu,Dai Chao. Simulation and Experiment of Effect of Short Circuit Current's Rise Rate on Fuse's Pre-arcing Characteristics[J]. Marine Electric & Electronic Technology, 2010, 30(2): 1-4. DOI: 10.3969/j.issn.1003-4862.2010.02.011
Authors:Jiang Xiaowei  Zhuang Jinwu  Dai Chao
Affiliation:Naval University of Engineering;Wuhan 430033;China
Abstract:
Current-limiting fuse usually breaks in investigate the effect of short circuit current's rate the rise process of short circuit current, in order to of rise on pre-arcing characteristic. Based on ANSYS analysis and fuse-element which is cross section is 0.16 mm^2, a simulation model is given in this paper. The simulation result shows that when the short-current's rate of rise is between 2-20 A/us, pre-arcing I^2t decreases when short circuit current's rate of rise increases: when short circuit current's rate of rise is above 10 A/us, change-rate of pre-arcing I^2t is lesser than 5%; When short circuit current's rate of rise is 2 A/us, the pre-arcing I^2t increase 21% compared with the one of 10 A/us. In the same short circuit current's rate of rise and shape of cross section, the pre-arcing I^2t and cross section's square are in direct proportion. The experiment proves the correction of the simulation's analysis.
Keywords:ANSYS
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