| 64D半自动闭塞测试系统开发 |
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| 引用本文： | 叶一彪,何涛,吴伟锴.64D半自动闭塞测试系统开发[J].铁路计算机应用,2010,19(11):51-54. |
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| 作者姓名： | 叶一彪 何涛 吴伟锴 |
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| 作者单位： | 兰州交通大学,光电技术与智能控制教育部重点实验室,兰州,730070 |
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| 摘 要： | 根据64D半自动闭塞的技术要求和工作原理,设计出一种新的继电半自动闭塞设备的电子化测试系统,并对其硬件和软件设计作了详细说明,同时对该测试系统代替现有的64D半自动闭塞设备进行探讨.该测试系统的设计遵循"故障-安全"原则,保证了系统的安全性和可靠性.
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| 关 键 词： | 半自动闭塞 故障-安全 测试系统 |
| 收稿时间： | 2010-11-15 |
Development of 64D Semi-automatic Block Test System |
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| YE Yi-biao,HE Tao,WU Wei-kai.Development of 64D Semi-automatic Block Test System[J].Railway Computer Application,2010,19(11):51-54. |
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| Authors: | YE Yi-biao HE Tao WU Wei-kai |
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| Institution: | (Key Laboratory of Opto-electronic Technology and Intelligent Control,Ministry of Education,Lanzhou Jiaotong University,Lanzhou 730070,China) |
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| Abstract: | According to technical requirements and working principle of 64D semi-automatic blocking,it was designed a new electronic-test system of the relay semi-automatic blocking devices,while its hardware and software design was illustrated in detail.The Test System could completely replace the existing 64D relay semi-occlusive equipment.The design of electronic-test module should be followed the fail-safe principle,guaranteeing redients the security and reliability of the System. |
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| Keywords: | semi-automatic blocking fail-safe Test System |
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