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ICP-PECVD法制备类金刚石膜
引用本文:孙丽,白杰,朱立强,刘东平.ICP-PECVD法制备类金刚石膜[J].大连铁道学院学报,2009(2):14-17.
作者姓名:孙丽  白杰  朱立强  刘东平
作者单位:大连交通大学机械工程学院;大连民族学院光电子技术研究所;
摘    要:以CH4为放电气体,利用电感耦合等离子体化学气相沉积(ICP—PECVD)法制备了类金刚石薄膜,使用FTIR、AFM、台阶仪对薄膜进行了表征,并对薄膜的沉积过程进行了光谱诊断(OES).研究了射频功率和基底在放电腔体中的位置对薄膜表面粗糙度、沉积速率和硬度的影响.实验结果表明:A位置处薄膜粗糙度随着功率的增加先减小后增大,随着射频功率的升高,薄膜的硬度逐渐增大,沉积速率先增大后减小,而薄膜硬度和沉积速率都随着与线圈中心距离的增加而减小.光谱诊断结果显示,随着功率的升高,Iβ/Iα和CH的强度呈增大趋势.结合上述研究结果,分析了影响薄膜生长的多种因素.

关 键 词:ICP-PECVD  类金刚石膜  粗糙度  沉积速率  光谱诊断

Study of Diamond-Like Carbon Films by ICP-PECVD
SUN Li,BAI Jie,ZHU Li-qiang,LIU Dong-ping.Study of Diamond-Like Carbon Films by ICP-PECVD[J].Journal of Dalian Railway Institute,2009(2):14-17.
Authors:SUN Li  BAI Jie  ZHU Li-qiang    LIU Dong-ping
Institution:SUN Li1,BAI Jie1,ZHU Li-qiang1,2,LIU Dong-ping2(1.School of Mechanical Engineering,Dalian Jiaotong University,Dalian 116028,China,2.Institute of Optoelectronic Technology,Dalian Nationalities University,Dalian 116600,China)
Abstract:Diamond-like carbon films are prepared using methane(CH4) inductive coupled plasma enhanced chemical vapor deposition(ICP-PECVD).The films are analyzed using fourier transform infrared spectroscopy(FTIR),atomic force microcopy(AFM) and Miriam steps.ICP-PECVD plasmas during film deposition are characterized in-situ by means of optical emission spectrometry(OES).The influences of discharge power and substrate distance from the coil region on film properties such as surface roughness,deposition rates,and hardn...
Keywords:ICP-PECVD  diamond-like carbon films  roughness  deposition rate  OES measurements  
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