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用边界扫描技术检测非边扫器件
引用本文:陈岩申,张波,李艳青.用边界扫描技术检测非边扫器件[J].舰船电子工程,2012,32(11):118-120.
作者姓名:陈岩申  张波  李艳青
作者单位:海军青岛雷达声纳修理厂,青岛,266100
摘    要:现代电路板越来越复杂,电路节点的物理访问难度也越来越大,传统的ICT在线检测技术和ATE自动测试技术难以满足故障检测和诊断要求,边界扫描技术已成为解决上述问题的有效手段。利用边界扫描技术不但可以检测电路板中的边扫器件,还可以实现通过编写宏语言对非边扫器件进行检测。

关 键 词:电路板  边界扫描  非边扫器件  IEEEll49

Application of Boundary-Scan Technology in Non-Boundary-Scan Devices Testing
CHEN Yanshen,ZHANG Bo,LI Yanqing.Application of Boundary-Scan Technology in Non-Boundary-Scan Devices Testing[J].Ship Electronic Engineering,2012,32(11):118-120.
Authors:CHEN Yanshen  ZHANG Bo  LI Yanqing
Institution:(Naval Radar and Sonar Repairing Factory,Qingdao 266100)
Abstract:In modern times, circuit board becomes more and more complicated, and it is more and more difficult for physical accessing to the circuit node. Traditional ICT technology and ATE technology can not satisfy the requirement of fault detection and diagnosis. The effec- tive means for solving this problem is boundary-scan technology. The boundary--scan technology not only apply to test the boundary-scan chips, but also test the non-boundary-scan devices by writing macro language.
Keywords:circuit board  boundary-scan  non-boundary-scan devices  IEEE1149
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