| 模拟电路拓扑可测性设计与分析 |
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| 引用本文： | 李任飞.模拟电路拓扑可测性设计与分析[J].西南交通大学学报,1992,5(2):102-107. |
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| 作者姓名： | 李任飞 |
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| 作者单位： | 西南交通大学运输工程系 |
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| 摘 要： | 本文根据HuangzF等提出的模拟电路故障拓扑可测条件，建立了拓扑可测性设计间题的
图论模型并给出了一种简便算法，讨论了可测性分析的方法并证明了对使用撕裂法处理大网络
十分有用的主子网可测性关系定理。
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| 关 键 词： | 模拟电路 图论 故障诊断 可测性 |
Design and Analiysis of the Topological Testability of Analog Circuits |
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| Li Renfei Dept.of Transp.Eng..Design and Analiysis of the Topological Testability of Analog Circuits[J].Journal of Southwest Jiaotong University,1992,5(2):102-107. |
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| Authors: | Li Renfei Deptof TranspEng |
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| Institution: | Li Renfei Dept.of Transp.Eng. |
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| Abstract: | According to the topological condition on the fault testability of analog circuits given by Huang Z F etc., this paper estab- lishes a model of testability design in graph theory and pre- sents a simple algorithm, discusses the method of testability analysis and proves a main-sub network testability relation theorem which is very useful for applying the decomposition method to handle large networks. |
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| Keywords: | analasis circuit graph theory fault diagnosis testability |
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