| 数字电路板时序电路测试方法 |
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| 引用本文： | 冯玉光,林文军,奚文骏,冷江. 数字电路板时序电路测试方法[J]. 舰船电子工程, 2010, 30(2): 165-167,179 |
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| 作者姓名： | 冯玉光 林文军 奚文骏 冷江 |
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| 作者单位： | 海军航空工程学院,烟台,264001 |
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| 摘 要： | 文章通过分析时序电路测试方法，研究了时序电路的功能测试方法。实现了时序电路功能的计算机辅助分析，提取时序功能模块的状态转换图。采用有向图作为的时序电路功能测试模型，采用图论的方法生成时序电路的功能验证测试向量。
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| 关 键 词： | 时序电路 功能分析 有向图 功能测试 |
Research on Testing Method for Sequential Circuits of the Digital PCB |
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| Feng Yuguang,Lin Wenjun,Xi Wenjun,Leng Jiang. Research on Testing Method for Sequential Circuits of the Digital PCB[J]. Ship Electronic Engineering, 2010, 30(2): 165-167,179 |
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| Authors: | Feng Yuguang Lin Wenjun Xi Wenjun Leng Jiang |
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| Affiliation: | (Naval Aeronautical and Astronautical University, Yantai 264001) |
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| Abstract: | The paper studies the function test method of the sequential circuit by analysis its test method. Realizing the sequential circuit function analysis using computer, and obtain the STG of the sequential circuit. Using the dir-ected graph as the functional test model of the sequential circuit. Using the method of the graph theory generate the functional validate test vector. |
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| Keywords: | sequential circuit function analysis directed graph function test |
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