| 基于边界扫描的混装电路板测试技术研究 |
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| 引用本文： | 蔡士闯,王学伟,王成刚.基于边界扫描的混装电路板测试技术研究[J].舰船电子工程,2011,31(7):137-140. |
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| 作者姓名： | 蔡士闯 王学伟 王成刚 |
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| 作者单位： | 1. 海军航空工程学院控制工程系 烟台264001
2. 海军航空工程学院基础实验部 烟台 264001 |
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| 摘 要： | 随着越来越多的FPGA等复杂逻辑器件应用到武器装备电路板上，电路板上JTAG器件与非JTAG器件并存，并使电路板结构功能日趋复杂，导致传统的方法已不能对该类电路板进行有效的测试。因此，对这种含复杂逻辑器件的混装电路进行测试是迫切需要解决的难题。为此，提出了一种基于onTAP软件实现针对该类电路板边界扫描的测试方法。
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| 关 键 词： | 测试 混装电路 边界扫描 |
Study on Test Method of Mixed Circuit Board Based on Boundary Scan |
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| Cai Shichuang,Wang Xuewei,Wang Chenggang.Study on Test Method of Mixed Circuit Board Based on Boundary Scan[J].Ship Electronic Engineering,2011,31(7):137-140. |
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| Authors: | Cai Shichuang Wang Xuewei Wang Chenggang |
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| Institution: | Cai Shichuang1) Wang Xuewei1) Wang Chenggang2)(Department of Control Engineering,Naval Aeronautical and Astronautical University1),Yantai 264001)(Department of Basic Experiment,Naval Aeronautical and Astrnautical University2),Yantai 264001) |
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| Abstract: | With more and more FPGA and other complex logic devices are applied to circuit board of weapons.JTAG devices and non-JTAG devices exist on the circuit board,so that the structure and function board has become more complex and the traditional method can not be effective in this kind of circuit board testing.Therefore,the testing of the mixed circuit with complex logic device is urgent to solve the problem.For this,a testing method based onTAP for such boundary scan testing is proposed. |
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| Keywords: | testing mixed circuit boundary scan |
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