| 真空镀膜膜层缺陷显微图像的边缘检测 |
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| 引用本文： | 丁宪生,马国欣. 真空镀膜膜层缺陷显微图像的边缘检测[J]. 中国水运, 2006, 6(10): 37-38 |
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| 作者姓名： | 丁宪生 马国欣 |
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| 作者单位： | 光电技术与智能控制教育部重点实验室(兰州交通大学)，华南理工大学电子与信息学院 |
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| 摘 要： | 真空镀膜膜层缺陷显微图像的边缘模糊、噪音大等,不利于工艺分析。采用多种边缘检测算子对显微获得的膜缺陷图像进行处理并进行了结果比较,表明：基于小波变换的边缘检测,可清晰突出缺陷图像轮廓、有效去除背景噪声,具有优异的边缘检测性能。
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| 关 键 词： | 镀膜缺陷 图像处理 小波变换 边缘检测 |
| 文章编号： | 1006-7973(2006)10-0037-02 |
| 修稿时间： | 2006-08-25 |
Edge Detecting For Microscope Image Defects of Vacuum Coating Film |
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| Ding Xiansheng,Ma Guoxin. Edge Detecting For Microscope Image Defects of Vacuum Coating Film[J]. China Water Transport, 2006, 6(10): 37-38 |
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| Authors: | Ding Xiansheng Ma Guoxin |
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| Affiliation: | Ding Xiansheng Ma Guoxin |
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| Abstract: | The characteristics of defects microscope image for vacuum coating film are edge blur,high noise,etc,go against process analysis.Several edge detection operators were employed to process it.The compare results show that based on wavelet transform edge detection operator could clearness detect the edge,the denoising effect and the edge detection capability is obvious better than the others. |
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| Keywords: | coating defects image processing wavelet transform edge detection |
| 本文献已被 CNKI 等数据库收录！ |
