| 便携式逻辑芯片功能检测仪 |
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| 引用本文： | 李玉,姚旺生.便携式逻辑芯片功能检测仪[J].舰船电子工程,2005,25(5):73-75. |
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| 作者姓名： | 李玉 姚旺生 |
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| 作者单位： | 海军工程大学电子工程学院,武汉430033 |
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| 摘 要： | 为了解决一些设备的维修问题,设计了便携式逻辑芯片功能检测仪.该仪器由单片机控制器、测试向量存储器、显示模块、通信电路、电源管理等部分组成.介绍了该仪器的软、硬件设计方法.
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| 关 键 词： | 逻辑检测仪 AT89C52 单片机 AT24C1024 |
| 收稿时间： | 2005-04-29 |
| 修稿时间： | 2005-05-23 |
Portable Tester for Logical Chips |
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| Li Yu ,Yao Wangsheng.Portable Tester for Logical Chips[J].Ship Electronic Engineering,2005,25(5):73-75. |
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| Authors: | Li Yu Yao Wangsheng |
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| Institution: | Institute of Electronic Engineering, Naval University of Engineering, Wuhan 430033 |
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| Abstract: | The portable tester for logical chips which is designed to solve the problems in maintaining some devices, is comof MCU, memory for testing vectors, display module, communication circuit, power management and so on. This paper describes the way of the software design and hardware design of the tester. |
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| Keywords: | logical tester AT89C52 MCU AT24C1024 |
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