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A novel design and optimization method for distributed amplifiers(DAs)is proposed to make the circuit design more convenient and efficient.This method combines artificial intelligence(AI)optimization with manual design by two loops,i.e.,outer manual loop and inner AI loop.The layout design is followed by AI optimization to take more influencing factors such as parasitic effect into account for the practicability.A DA with three gain cells is designed and optimized in a standard 0.18μm complementary metal-oxide-semiconductor(CMOS)technology to verify the proposed method.With a chip area of only 0.55 mm2,the DA provides 9.8 dB average forward gain from 1 to 15.2 GHz.The output power at 1 dB output compression point is more than 7.7 dBm in the 2-14 GHz frequency band and the peak power-added efficiency(PAE)is 10.6%.The measurement results validate the proposed method as a robust DA design procedure for improving circuit performance and design efficiency. 相似文献
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[Objective]Aiming at the deficiency of the existing line impedance stability network (LISN) in the electromagnetic pulse protection capability, a LISN suitable for the pulse current injection (PCI) test of electrical and electronic equipment is proposed. [Methods]Aiming at the characteristics of high peak value and fast rise of the pulse current in PCI testing, the circuit structure and physical structure of the LISN are improved on the existing basis through PSpice time-domain and frequency-domain simulation combined with engineering design requirements, thereby giving it good nanosecond pulse protection performance and impedance stability at the same time. Pulse current protection performance test and impedance curve test experiments are then designed and carried out.[Results]The experimental results show that the improved LISN can attenuate the injected pulse current by 60 times, while the error of its impedance curve is less than 5% compared with the Type 5 µH LISN in GJB 151B-2013. [Conclusions]The proposed LISN has good impedance stability and decoupling ability, and can be used in the PCI testing of electrical and electronic equipment in order to protect the power supply and improve the repeatability of testing. © 2023 Chinese Journal of Ship Research. All rights reserved. 相似文献
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