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IntroductionVacuum Fluorescent Display(VFD)is nowwidely used in many fields,such as household elec-tric appliance,instruments and meters,communi-cation device,OA,and so on[1].The VFD acceler-ated life test is urgently needed for rapid life esti-mation because of the rival market and the quicklydesigned speed.To the author's knowledge,so farthere are no research reports on VFD acceleratedlife test by logarithmic normal distribution.In view of merits of the step-stress acceleratedlife test… 相似文献
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